Fast, Sensitive and Accurate Egfr and K-Ras Mutation Screening Using High Resolution Melting (Hrm)

D.A.M. Heideman; F.B.J.M. Thunnissen; D. Kramer; M.W. Doeleman; E.F. Smit; P.E. Postmus; C.J.L.M. Meijer; P.J.F. Snijders

Fast, Sensitive and Accurate Egfr and K-Ras Mutation Screening Using High Resolution Melting (Hrm)

D.A.M. Heideman, F.B.J.M. Thunnissen, D. Kramer, M.W. Doeleman, E.F. Smit, P.E. Postmus, C.J.L.M. Meijer, P.J.F. Snijders

Research output: Contribution to journal › Meeting Abstract › Other research output

Original language	Undefined/Unknown
Pages (from-to)	40-40
Journal	Annals of Oncology
Volume	20
Publication status	Published - 2009

Cite this

@article{0d36992f569641c69fa11bc773e45002,

title = "Fast, Sensitive and Accurate Egfr and K-Ras Mutation Screening Using High Resolution Melting (Hrm)",

author = "D.A.M. Heideman and F.B.J.M. Thunnissen and D. Kramer and M.W. Doeleman and E.F. Smit and P.E. Postmus and C.J.L.M. Meijer and P.J.F. Snijders",

year = "2009",

language = "Undefined/Unknown",

volume = "20",

pages = "40--40",

journal = "Annals of Oncology",

issn = "0923-7534",

publisher = "Oxford University Press",

}

TY - JOUR

T1 - Fast, Sensitive and Accurate Egfr and K-Ras Mutation Screening Using High Resolution Melting (Hrm)

AU - Heideman, D.A.M.

AU - Thunnissen, F.B.J.M.

AU - Kramer, D.

AU - Doeleman, M.W.

AU - Smit, E.F.

AU - Postmus, P.E.

AU - Meijer, C.J.L.M.

AU - Snijders, P.J.F.

PY - 2009

Y1 - 2009

M3 - Meeting Abstract

SN - 0923-7534

VL - 20

SP - 40

EP - 40

JO - Annals of Oncology

JF - Annals of Oncology

ER -