Shape Orientation Pattern

Vikram Venkatraghavan; Maruti Agarwal; Ajoy Roy

doi:https://doi.org/10.1109/LSP.2009.2022567

Shape Orientation Pattern

Vikram Venkatraghavan, Maruti Agarwal, Ajoy Roy

Research output: Contribution to journal › Article › Academic › peer-review

5 Citations (Scopus)

Abstract

Due to the variety of shapes as well as the diversity of applications there does not exist any single method for computing the shape orientation of all shapes. In this paper, we introduce a new shape orientation measure, shape orientation pattern, to find the crisp and fuzzy shape orientation as well as shape orientability from any shape. We also illustrate that the new shape orientation measure can be used as a RST invariant shape descriptor.

Original language	English
Pages (from-to)	711-714
Number of pages	4
Journal	IEEE Signal Processing Letters
Volume	16
Issue number	8
DOIs	https://doi.org/10.1109/LSP.2009.2022567
Publication status	Published - 2009
Externally published	Yes

Keywords

Orientability
RST invariant descriptor
orientation
shape orientation pattern

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https://doi.org/10.1109/LSP.2009.2022567

Cite this

@article{c8f36db099844ab58bd0d27096555094,

title = "Shape Orientation Pattern",

abstract = "Due to the variety of shapes as well as the diversity of applications there does not exist any single method for computing the shape orientation of all shapes. In this paper, we introduce a new shape orientation measure, shape orientation pattern, to find the crisp and fuzzy shape orientation as well as shape orientability from any shape. We also illustrate that the new shape orientation measure can be used as a RST invariant shape descriptor.",

keywords = "Orientability, RST invariant descriptor, orientation, shape orientation pattern",

author = "Vikram Venkatraghavan and Maruti Agarwal and Ajoy Roy",

year = "2009",

doi = "https://doi.org/10.1109/LSP.2009.2022567",

language = "English",

volume = "16",

pages = "711--714",

journal = "IEEE Signal Processing Letters",

issn = "1070-9908",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "8",

}

TY - JOUR

T1 - Shape Orientation Pattern

AU - Venkatraghavan, Vikram

AU - Agarwal, Maruti

AU - Roy, Ajoy

PY - 2009

Y1 - 2009

N2 - Due to the variety of shapes as well as the diversity of applications there does not exist any single method for computing the shape orientation of all shapes. In this paper, we introduce a new shape orientation measure, shape orientation pattern, to find the crisp and fuzzy shape orientation as well as shape orientability from any shape. We also illustrate that the new shape orientation measure can be used as a RST invariant shape descriptor.

AB - Due to the variety of shapes as well as the diversity of applications there does not exist any single method for computing the shape orientation of all shapes. In this paper, we introduce a new shape orientation measure, shape orientation pattern, to find the crisp and fuzzy shape orientation as well as shape orientability from any shape. We also illustrate that the new shape orientation measure can be used as a RST invariant shape descriptor.

KW - Orientability

KW - RST invariant descriptor

KW - orientation

KW - shape orientation pattern

UR - http://www.scopus.com/inward/record.url?scp=85008062047&partnerID=8YFLogxK

U2 - https://doi.org/10.1109/LSP.2009.2022567

DO - https://doi.org/10.1109/LSP.2009.2022567

M3 - Article

SN - 1070-9908

VL - 16

SP - 711

EP - 714

JO - IEEE Signal Processing Letters

JF - IEEE Signal Processing Letters

IS - 8

ER -

Shape Orientation Pattern

Abstract

Keywords

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