A comparison of methods for the evaluation of binary measurement systems

W.N. van Wieringen, E.R. van den Heuvel

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30 Citations (Scopus)


Many quality programs prescribe a measurement system analysis (MSA) to be performed on the key quality characteristics. This guarantees the reliability of the acquired data, which serve as the basis for drawing conclusions with respect to the behavior of the key quality characteristics. When dealing with continuous characteristics, the Gauge R&R is regarded as the statistical technique in MSA. For binary characteristics, no such universally accepted equivalent is available. We discuss methods that could serve as an MSA for binary data. We argue that a latent class model is the most promising candidate. Copyright © Taylor & Francis Inc.
Original languageEnglish
Pages (from-to)495-507
Number of pages13
JournalQuality engineering
Issue number4
Publication statusPublished - 1 Oct 2005


  • Intraclass correlation coefficient
  • Kappa
  • Latent class model
  • Log-linear model
  • Measurement system analysis

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