A comparison of methods for the evaluation of binary measurement systems

W.N. van Wieringen; E.R. van den Heuvel

doi:https://doi.org/10.1080/08982110500225562

A comparison of methods for the evaluation of binary measurement systems

W.N. van Wieringen, E.R. van den Heuvel

Research output: Contribution to journal › Article › Academic › peer-review

30 Citations (Scopus)

Abstract

Many quality programs prescribe a measurement system analysis (MSA) to be performed on the key quality characteristics. This guarantees the reliability of the acquired data, which serve as the basis for drawing conclusions with respect to the behavior of the key quality characteristics. When dealing with continuous characteristics, the Gauge R&R is regarded as the statistical technique in MSA. For binary characteristics, no such universally accepted equivalent is available. We discuss methods that could serve as an MSA for binary data. We argue that a latent class model is the most promising candidate. Copyright © Taylor & Francis Inc.

Original language	English
Pages (from-to)	495-507
Number of pages	13
Journal	Quality engineering
Volume	17
Issue number	4
DOIs	https://doi.org/10.1080/08982110500225562
Publication status	Published - 1 Oct 2005

Keywords

Intraclass correlation coefficient
Kappa
Latent class model
Log-linear model
Measurement system analysis

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@article{e6990074a8c44e0b832ed0de6901991d,

title = "A comparison of methods for the evaluation of binary measurement systems",

abstract = "Many quality programs prescribe a measurement system analysis (MSA) to be performed on the key quality characteristics. This guarantees the reliability of the acquired data, which serve as the basis for drawing conclusions with respect to the behavior of the key quality characteristics. When dealing with continuous characteristics, the Gauge R&R is regarded as the statistical technique in MSA. For binary characteristics, no such universally accepted equivalent is available. We discuss methods that could serve as an MSA for binary data. We argue that a latent class model is the most promising candidate. Copyright {\textcopyright} Taylor & Francis Inc.",

keywords = "Intraclass correlation coefficient, Kappa, Latent class model, Log-linear model, Measurement system analysis",

author = "{van Wieringen}, W.N. and {van den Heuvel}, E.R.",

year = "2005",

month = oct,

day = "1",

doi = "https://doi.org/10.1080/08982110500225562",

language = "English",

volume = "17",

pages = "495--507",

journal = "Quality engineering",

issn = "0898-2112",

publisher = "Taylor and Francis Ltd.",

number = "4",

}

TY - JOUR

T1 - A comparison of methods for the evaluation of binary measurement systems

AU - van Wieringen, W.N.

AU - van den Heuvel, E.R.

PY - 2005/10/1

Y1 - 2005/10/1

N2 - Many quality programs prescribe a measurement system analysis (MSA) to be performed on the key quality characteristics. This guarantees the reliability of the acquired data, which serve as the basis for drawing conclusions with respect to the behavior of the key quality characteristics. When dealing with continuous characteristics, the Gauge R&R is regarded as the statistical technique in MSA. For binary characteristics, no such universally accepted equivalent is available. We discuss methods that could serve as an MSA for binary data. We argue that a latent class model is the most promising candidate. Copyright © Taylor & Francis Inc.

AB - Many quality programs prescribe a measurement system analysis (MSA) to be performed on the key quality characteristics. This guarantees the reliability of the acquired data, which serve as the basis for drawing conclusions with respect to the behavior of the key quality characteristics. When dealing with continuous characteristics, the Gauge R&R is regarded as the statistical technique in MSA. For binary characteristics, no such universally accepted equivalent is available. We discuss methods that could serve as an MSA for binary data. We argue that a latent class model is the most promising candidate. Copyright © Taylor & Francis Inc.

KW - Intraclass correlation coefficient

KW - Kappa

KW - Latent class model

KW - Log-linear model

KW - Measurement system analysis

UR - http://www.scopus.com/inward/record.url?scp=28244492797&partnerID=8YFLogxK

U2 - https://doi.org/10.1080/08982110500225562

DO - https://doi.org/10.1080/08982110500225562

M3 - Article

SN - 0898-2112

VL - 17

SP - 495

EP - 507

JO - Quality engineering

JF - Quality engineering

IS - 4

ER -

A comparison of methods for the evaluation of binary measurement systems

Abstract

Keywords

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