TY - JOUR
T1 - Confidence intervals on fit parameters derived from optical reflectance spectroscopy measurements
AU - Amelink, Arjen
AU - Robinson, Dominic J.
AU - Sterenborg, Henricus J. C. M.
PY - 2008
Y1 - 2008
N2 - We validate a simple method for determining the confidence intervals on fitted parameters derived from modeling optical reflectance spectroscopy measurements using synthetic datasets. The method estimates the parameter confidence intervals as the square roots of the diagonal elements of the covariance matrix, obtained by multiplying the inverse of the second derivative matrix of chi(2) with respect to its free parameters by chi(2)/v, with v the number of degrees of freedom. We show that this method yields correct confidence intervals as long as the model used to describe the data is correct. Imperfections in the fitting model introduces a bias in the fitted parameters that greatly exceeds the estimated confidence intervals. We investigate the use of various methods to identify and subsequently minimize the bias in the fitted parameters associated with incorrect modeling. (C) 2008 Society of Photo-Optical Instrumentation Engineers. [DOI: 10.1117/1.2982523]
AB - We validate a simple method for determining the confidence intervals on fitted parameters derived from modeling optical reflectance spectroscopy measurements using synthetic datasets. The method estimates the parameter confidence intervals as the square roots of the diagonal elements of the covariance matrix, obtained by multiplying the inverse of the second derivative matrix of chi(2) with respect to its free parameters by chi(2)/v, with v the number of degrees of freedom. We show that this method yields correct confidence intervals as long as the model used to describe the data is correct. Imperfections in the fitting model introduces a bias in the fitted parameters that greatly exceeds the estimated confidence intervals. We investigate the use of various methods to identify and subsequently minimize the bias in the fitted parameters associated with incorrect modeling. (C) 2008 Society of Photo-Optical Instrumentation Engineers. [DOI: 10.1117/1.2982523]
U2 - https://doi.org/10.1117/1.2982523
DO - https://doi.org/10.1117/1.2982523
M3 - Article
C2 - 19021424
SN - 1083-3668
VL - 13
SP - 054044
JO - Journal of biomedical optics
JF - Journal of biomedical optics
IS - 5
ER -