Controlled Light Exposure Microscopy (CLEM) for prolonged live-cell imaging and strongly reduced photobleaching

R. Hoebe; W. De Vos; C. Van Oven; P. Zoon; S. Lambrechts; P. Van Oostveldt; D. Gadella; R. Van Noorden; E. Manders

doi:https://doi.org/10.1017/S1431927608089010

Controlled Light Exposure Microscopy (CLEM) for prolonged live-cell imaging and strongly reduced photobleaching

R. Hoebe, W. De Vos, C. Van Oven, P. Zoon, S. Lambrechts, P. Van Oostveldt, D. Gadella, R. Van Noorden, E. Manders

Research output: Contribution to journal › Article › Academic › peer-review

Original language	English
Pages (from-to)	718
Number of pages	1
Journal	Microscopy and microanalysis
Volume	14
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927608089010
Publication status	Published - Aug 2008

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https://doi.org/10.1017/S1431927608089010

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title = "Controlled Light Exposure Microscopy (CLEM) for prolonged live-cell imaging and strongly reduced photobleaching",

author = "R. Hoebe and Vos, {W. De} and Oven, {C. Van} and P. Zoon and S. Lambrechts and Oostveldt, {P. Van} and D. Gadella and Noorden, {R. Van} and E. Manders",

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AU - Hoebe, R.

AU - Vos, W. De

AU - Oven, C. Van

AU - Zoon, P.

AU - Lambrechts, S.

AU - Oostveldt, P. Van

AU - Gadella, D.

AU - Noorden, R. Van

AU - Manders, E.

PY - 2008/8

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SP - 718

JO - Microscopy and microanalysis

JF - Microscopy and microanalysis

IS - SUPPL. 2

ER -

Controlled Light Exposure Microscopy (CLEM) for prolonged live-cell imaging and strongly reduced photobleaching

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