Observation of an exponential FeSi spacer thickness dependence of the antiferromagnetic exchange coupling in Fe/Si-based multilayers

J. T. Kohlhepp; J. J. De Vries; F. J.A. Den Broeder; R. Coehoorn; R. M. Jungblut; A. Reinders; G. J. Strijkers; A. A. Smits; W. J.M. De Jonge

doi:https://doi.org/10.1557/proc-475-593

Observation of an exponential FeSi spacer thickness dependence of the antiferromagnetic exchange coupling in Fe/Si-based multilayers

J. T. Kohlhepp, J. J. De Vries, F. J.A. Den Broeder, R. Coehoorn, R. M. Jungblut, A. Reinders, G. J. Strijkers, A. A. Smits, W. J.M. De Jonge

Research output: Contribution to journal › Article › Academic › peer-review

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Abstract

The magnetic interlayer exchange coupling in Fe/Si-based thin film structures employing sputtered multilayers with variations of Si-alloyed Fe for the magnetic layers and Fe-alloyed Si spacers, as well as wedge-shaped MBE-grown Fe/Si/Fe sandwich samples has been systematically studied. From structural and magnetic analysis it is concluded that ultrathin Si and Fe_xSi_100-x (x < 50) spacer layers transform into a crystalline iron silicide with a composition close to Fe₅₀Si₅₀. The exchange coupling mediated by this metallic silicide is antiferromagnetic and depends on the spacer thickness in an exponential, i.e. non-oscillatory, manner with a universal characteristic decay length of 3-4 angstrom at room temperature. This observation can be qualitatively explained within the framework of a recent coupling theory on the premise that the FeSi interlayer has the metastable CsCl(B2)-structure.

Original language	English
Pages (from-to)	593-604
Number of pages	12
Journal	Materials Research Society Symposium - Proceedings
Volume	475
DOIs	https://doi.org/10.1557/proc-475-593
Publication status	Published - 1997
Event	Proceedings of the 1997 MRS Spring Meeting - San Francisco, CA, USA Duration: 31 Mar 1997 → 2 Apr 1997

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Kohlhepp, J. T., De Vries, J. J., Den Broeder, F. J. A., Coehoorn, R., Jungblut, R. M., Reinders, A., Strijkers, G. J., Smits, A. A., & De Jonge, W. J. M. (1997). Observation of an exponential FeSi spacer thickness dependence of the antiferromagnetic exchange coupling in Fe/Si-based multilayers. Materials Research Society Symposium - Proceedings, 475, 593-604. https://doi.org/10.1557/proc-475-593

@article{fa03d6f5566e48d5b072deacd2c59552,

title = "Observation of an exponential FeSi spacer thickness dependence of the antiferromagnetic exchange coupling in Fe/Si-based multilayers",

abstract = "The magnetic interlayer exchange coupling in Fe/Si-based thin film structures employing sputtered multilayers with variations of Si-alloyed Fe for the magnetic layers and Fe-alloyed Si spacers, as well as wedge-shaped MBE-grown Fe/Si/Fe sandwich samples has been systematically studied. From structural and magnetic analysis it is concluded that ultrathin Si and FexSi100-x (x < 50) spacer layers transform into a crystalline iron silicide with a composition close to Fe50Si50. The exchange coupling mediated by this metallic silicide is antiferromagnetic and depends on the spacer thickness in an exponential, i.e. non-oscillatory, manner with a universal characteristic decay length of 3-4 angstrom at room temperature. This observation can be qualitatively explained within the framework of a recent coupling theory on the premise that the FeSi interlayer has the metastable CsCl(B2)-structure.",

author = "Kohlhepp, {J. T.} and {De Vries}, {J. J.} and {Den Broeder}, {F. J.A.} and R. Coehoorn and Jungblut, {R. M.} and A. Reinders and Strijkers, {G. J.} and Smits, {A. A.} and {De Jonge}, {W. J.M.}",

year = "1997",

doi = "https://doi.org/10.1557/proc-475-593",

language = "English",

volume = "475",

pages = "593--604",

journal = "Materials Research Society Symposium - Proceedings",

issn = "0272-9172",

publisher = "Materials Research Society",

note = "Proceedings of the 1997 MRS Spring Meeting ; Conference date: 31-03-1997 Through 02-04-1997",

}

Kohlhepp, JT, De Vries, JJ, Den Broeder, FJA, Coehoorn, R, Jungblut, RM, Reinders, A, Strijkers, GJ, Smits, AA & De Jonge, WJM 1997, 'Observation of an exponential FeSi spacer thickness dependence of the antiferromagnetic exchange coupling in Fe/Si-based multilayers', Materials Research Society Symposium - Proceedings, vol. 475, pp. 593-604. https://doi.org/10.1557/proc-475-593

TY - JOUR

T1 - Observation of an exponential FeSi spacer thickness dependence of the antiferromagnetic exchange coupling in Fe/Si-based multilayers

AU - Kohlhepp, J. T.

AU - De Vries, J. J.

AU - Den Broeder, F. J.A.

AU - Coehoorn, R.

AU - Jungblut, R. M.

AU - Reinders, A.

AU - Strijkers, G. J.

AU - Smits, A. A.

AU - De Jonge, W. J.M.

PY - 1997

Y1 - 1997

N2 - The magnetic interlayer exchange coupling in Fe/Si-based thin film structures employing sputtered multilayers with variations of Si-alloyed Fe for the magnetic layers and Fe-alloyed Si spacers, as well as wedge-shaped MBE-grown Fe/Si/Fe sandwich samples has been systematically studied. From structural and magnetic analysis it is concluded that ultrathin Si and FexSi100-x (x < 50) spacer layers transform into a crystalline iron silicide with a composition close to Fe50Si50. The exchange coupling mediated by this metallic silicide is antiferromagnetic and depends on the spacer thickness in an exponential, i.e. non-oscillatory, manner with a universal characteristic decay length of 3-4 angstrom at room temperature. This observation can be qualitatively explained within the framework of a recent coupling theory on the premise that the FeSi interlayer has the metastable CsCl(B2)-structure.

AB - The magnetic interlayer exchange coupling in Fe/Si-based thin film structures employing sputtered multilayers with variations of Si-alloyed Fe for the magnetic layers and Fe-alloyed Si spacers, as well as wedge-shaped MBE-grown Fe/Si/Fe sandwich samples has been systematically studied. From structural and magnetic analysis it is concluded that ultrathin Si and FexSi100-x (x < 50) spacer layers transform into a crystalline iron silicide with a composition close to Fe50Si50. The exchange coupling mediated by this metallic silicide is antiferromagnetic and depends on the spacer thickness in an exponential, i.e. non-oscillatory, manner with a universal characteristic decay length of 3-4 angstrom at room temperature. This observation can be qualitatively explained within the framework of a recent coupling theory on the premise that the FeSi interlayer has the metastable CsCl(B2)-structure.

UR - http://www.scopus.com/inward/record.url?scp=0031367326&partnerID=8YFLogxK

U2 - https://doi.org/10.1557/proc-475-593

DO - https://doi.org/10.1557/proc-475-593

M3 - Article

SN - 0272-9172

VL - 475

SP - 593

EP - 604

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

T2 - Proceedings of the 1997 MRS Spring Meeting

Y2 - 31 March 1997 through 2 April 1997

ER -

Observation of an exponential FeSi spacer thickness dependence of the antiferromagnetic exchange coupling in Fe/Si-based multilayers

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